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Part # NN-EENP-P-CM13(5, 5)

Price: $1250.00

Exposed End NeedleProbe Specification
Technical Data Typical Range
Needle Material Ag2Ga NA
Needle Length 5 µm 3-7 µm
Needle Angle 12° 7°-15°
Diameter of the exposed Needle 100 nm 50 - 150 nm
Needles Electrical Resistivity 1.05×10-7 Ωm 1 - 1.1 ×10-7 Ωm
Tip radius 100 nm 50 -200 nm
Tip material Pt NA
Insulation material Parylene NA
Insulation coating thickness 300 nm 200 to 400 nm (customer choice)
Background current leakage <10 pA 0-10 pA
Diffusion-limited value on CV measurement 200 pA 150 to 300 pA



AFM Cantilever Specifications
Technical Data Typical Range
Force Constant 0.2 N/m 0.07 - 0.4 N/m
Resonance Freq. 13 kHz 9 - 17 kHz
Cantilever Length 450 μm 440 - 460 μm
Cantilever Mean Width 50 μm 45 - 55 μm
Cantilever Thickness 2.0 μm 1.0 - 3.0 μm
Cantilever Shape Cross-section Rectangular / Trapezoidal
Number of Cantilevers 1 per chip
Tip Height 14 μm ( not including needle )
Tip Offset 15 - 25 μm
Needle Material Ag2Ga
Cantilever and Chip Material Single Crystal Silicon
Chip Size (industry standard) 3400 μm (L) x 1600 μm (W) x 300 μm (T)
Coating Gold reflex (on non-tip side)
Number of AFM probes 5 AFM probes



Packaging Specification
Package Length 3-4 mm Per Customer Choice
Package Width 1.5-3 mm Per Customer Choice
Chip Holder Material Cu Clad
Chip Holder Thickness 0.4 mm
Insulation Layer GC Varnish
Wire Length 5-10 cm Per Customer Choice
Overall Thickness of the Device Less Than 1mm

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