| AFM Cantilever Specifications |
| Technical Data |
Typical |
Range |
| Force Constant |
0.2 N/m |
0.07 - 0.4 N/m |
| Resonance Freq. |
13 kHz |
9 - 17 kHz |
| Cantilever Length |
450 μm |
440 - 460 μm |
| Cantilever Mean Width |
50 μm |
45 - 55 μm |
| Cantilever Thickness |
2.0 μm |
1.0 - 3.0 μm |
| Cantilever Shape Cross-section |
Rectangular / Trapezoidal |
| Number of Cantilevers |
1 per chip |
| Tip Height |
14 μm ( not including needle ) |
| Tip Offset |
15 - 25 μm |
| Needle Material |
Ag2Ga |
| Cantilever and Chip Material |
Single Crystal Silicon |
| Chip Size (industry standard) |
3400 μm (L) x 1600 μm (W) x 300 μm (T) |
| Coating |
Gold reflex (on non-tip side) |
| Number of AFM probes |
5 AFM probes |
