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Part # NN-EENP-FM60(0, 5)

Price: $650.00

Tip specification
Technical Data Typical Range
Tip radius 200 nm 150 -300 nm
Tip material Pt NA
Insulation material Parylene NA
Insulation coating thickness 300 nm 200 to 400 nm (customer choice)
Background current leakage <10 pA 0-10 pA
Diffusion-limited value on CV measurement 200 pA 150 to 300 pA

 

 

AFM Cantilever Specifications
Technical Data Typical Range
Force Constant 3 N/m 1 - 7 N/m
Resonance Freq. 60 kHz 45- 75 kHz
Cantilever Length 225 μm 210 - 235 μm
Cantilever Mean Width 30 µm 27 - 37 µm
Cantilever Thickness 2.0 μm 1.5 - 3.5µm
Cantilever Shape Cross-section Rectangular / Trapezoidal
Number of Cantilevers 1 per chip
Tip Height 14 μm ( not including needle )
Tip Offset 15 - 25 μm
Needle Material Ag2Ga
Cantilever and Chip Material Single Crystal Silicon
Chip Size (industry standard) 3400 μm (L) x 1600 μm (W) x 300 μm (T)
Coating Gold reflex (on non-tip side)
Number of AFM probes 5 AFM probes