NN-HAR-T300

Pack Size
Length of Nanoneedle
Specific requirement:

Nanoneedle specification
Technical Data Typical Range
Needle Material
Ag2Ga
NA
Needle Length
1-3 μm
3-7 μm
7-13 μm
NA
Tip radius of curvature
50 nm
20 -100 nm
Needle Angle
12°
7°-15°
Needles Electrical Resistivity
1.05×10-7 Ωm
1 - 1.1 ×10-7 Ωm
Electrical resistance of tip and AFM cantilever
1-3 μm
3-7 μm
7-13 μm
1-3 μm
3-7 μm
7-13 μm
30 Ω
65 Ω
100 Ω
15-45 Ω
50-80 Ω
80-120 Ω



AFM Cantilever Specifications
Technical Data Typical Range
Force Constant 40 N/m 25 - 75 N/m
Resonance Freq. 300 kHz 200- 400 kHz
Cantilever Length 125 μm 115 - 145 μm
Cantilever Mean Width 40 µm 35 - 45 µm
Cantilever Thickness 4.0 μm 3.5 - 4.5µm
Cantilever Shape Cross-section Rectangular / Trapezoidal
Number of Cantilevers 1 per chip
Tip Height 14 μm ( not including needle )
Tip Offset 15 - 25 μm
Cantilever and Chip Material Single Crystal Silicon
Chip Size (industry standard) 3400 μm (L) x 1600 μm (W) x 300 μm (T)
Coating Gold reflex (on non-tip side)

* NanoNeedle longer than 10 μm will be provided by special order (Max 100μm)
* Different coating materials are available
  For more information please contact us at info@nauganeedles.com

 SEM movie of an Ultra High Aspect Ratio NeedleProbe (HAR-NP) during AFM scanning


 Micro-Wilhelmy and Related Liquid Property Measurements Using Constant-Diameter Nanoneedle-Tipped Atomic Force Microscope Probes

(a) SEM images of a NeedleProbe with simple cylindrical geometry.  (b) Schematic o the AFM experimental setup for liquid probing using NeedleProbe. (c) Top: schematic of the meniscus formation between the NeedleProbe and the liquid surface. Bottom: Typical force vs. distance (F-D) curve of the NeedleProbe on a liquid surface. The red line is extension and the blue line is the retraction force curve. 

 

 Selective self-assembly at room temperature of individual freestanding Ag2Ga alloy nanoneedles

X-ray-diffraction pattern from needles grown on a thin film of Ag.Inset(SAD) selected area diffraction pattern from a single needle that shows that single needles are highly crystalline.


 Metallic High Aspect Ratio AFM Probe Catalog

 Label-free detection of the aptamer binding on protein patterns using Kelvin probe force microscopy (KPFM)



The KPFM characterization of lysozyme patterns.


 Free-Standing Biomimetic Polymer Membrane Imaged with Atomic Force Microscopy

(a) SEM images of a NeedleProbe with simple cylindrical geometry.  (b) Schematic o the AFM experimental setup for liquid probing using NeedleProbe. (c) Top: schematic of the meniscus formation between the NeedleProbe and the liquid surface. Bottom: Typical force vs. distance (F-D) curve of the NeedleProbe on a liquid surface. The red line is extension and the blue line is the retraction force curve.


 Subsurface characterization of carbon nanotubes in polymer composites via quantitative electric force microscopy

Enhanced EFM subsurface imaging of 0.5% SWCNT (LA)–polyimide nanocomposite film using an HAR probe. EFM bias voltage and lift height is 12 V and 50 nm, respectively. (a) SEM image of a conventional probe, (b) SEM image of an HAR probe. Inset: enlarged image of circled area near tip apex. (c) and (d) EFM phase image of subsurface CNTs using a conventional and HAR probe, respectively. (e) and (f) Cross-section analysis of segmented line at (c) and (d), respectively. EFM phase scale 20◦. The EFM phase signal at circled peak in (f) is both stronger and sharper than that in (e).