Exposed End STM Probe With Platinum tip

NN-EEUSNP
Exposed End Ultra Sharp NanoProbe (EE-USNP)
Applications: Applications: STM, Nano-Probing, Nano-Manipulation, micro and nano probe station.

Starting from

$750.00

Specs: Grown co-axially at the tip of a sharp Tungsten wire (100 μm in diameter)(250 μm in diameter)(500 μm in diameter). The entire probe is sealed with Parylene but exposed at the very end of the Nanoneedle. EE-USNP is perfect for electrical measurement at the nanoscale under conductive liquid and easy to mount in different manipulator, probe station and STM. Diameter = 50-100 nm NanoProbe Length= 3-7 μmNanoProbe Length= 8-13 μm

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NanoProbe specification
Technical DataTypicalRange
NanoProbe materialAg2GaNA
NanoProbe Length (µm)53-7
NanoProbe Length (µm)108-13
Tip radius of curvature (nm)5025 -100
NanoProbe electrical resistivity (Ωm)1.05×10-71 – 1.1 ×10-7
Electrical resistance (Ω)3015 – 45
Lateral deflection tolerance  (nm)500300-1000
Current tolerance (mA)51 – 10
Tip materialPtNA
Insulation materialParyleneNA
Insulation coating thickness200 nm150 to 250 nm
Background current leakage<10 pA0-10 pA
Diffusion-limited value on CV measurement200 pA150 to 300 pA
Substrate Specifications
Technical DataTypicalOption
Substrate MaterialTungsten WirePer request, other substrate (e.g. Pt/Ir) can be provided
Substrate Dimension20 mm (L) × 100 µm (D)Per request, different wire length (e.g. 5 to 25 mm) can be provided
Number of NanoProbes10 NanoProbes

 

Exposed End Ultra Sharp NeedleProbe (EEUSNP)

NaugaNeedles introduces a newly exposed end nano-electrodes on their USNPTM probes. The basic structure of these probes is the tungsten probe with a high aspect ratio Nanoneedle. The entire probe is sealed with Parylene and exposed at the very end of the Nanoneedle and exchanged with platinum. To avoid any possible leakage a heat-shrink and epoxy are covering the trunk of the tungsten probe. These probes make it possible to perform transport measurement by a nano-electrode (the platinum tip) under the liquid. They are easy to mount in different manipulator, probe station and STM.

a) Schematic of the device, b) Finished product grabbed by the tweeter, c) SEM image of the needle and exposed tip, d) Optical image of the tip, and e) CV curve of the tested device.
NanoProbe specification
Technical DataTypicalRange
NanoProbe materialAg2GaNA
NanoProbe Length (µm)53-7
NanoProbe Length (µm)108-13
Tip radius of curvature (nm)5025 -100
NanoProbe electrical resistivity (Ωm)1.05×10-71 – 1.1 ×10-7
Electrical resistance (Ω)3015 – 45
Lateral deflection tolerance  (nm)500300-1000
Current tolerance (mA)51 – 10
Tip materialPtNA
Insulation materialParyleneNA
Insulation coating thickness200 nm150 to 250 nm
Background current leakage<10 pA0-10 pA
Diffusion-limited value on CV measurement200 pA150 to 300 pA
Substrate Specifications
Technical DataTypicalOption
Substrate MaterialTungsten WirePer request, other substrate (e.g. Pt/Ir) can be provided
Substrate Dimension20 mm (L) × 100 µm (D)Per request, different wire length (e.g. 5 to 25 mm) can be provided
Number of NanoProbes10 NanoProbes

 

Exposed End Ultra Sharp NeedleProbe (EEUSNP)

NaugaNeedles introduces a newly exposed end nano-electrodes on their USNPTM probes. The basic structure of these probes is the tungsten probe with a high aspect ratio Nanoneedle. The entire probe is sealed with Parylene and exposed at the very end of the Nanoneedle and exchanged with platinum. To avoid any possible leakage a heat-shrink and epoxy are covering the trunk of the tungsten probe. These probes make it possible to perform transport measurement by a nano-electrode (the platinum tip) under the liquid. They are easy to mount in different manipulator, probe station and STM.

a) Schematic of the device, b) Finished product grabbed by the tweeter, c) SEM image of the needle and exposed tip, d) Optical image of the tip, and e) CV curve of the tested device.

Exposed End STM Probe With Platinum tip Downloadable Catalog

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