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Specs: Silver/Gallium nanoneedle grown on AFM tip

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Nanoneedle specification
Technical DataTypicalRange
Needle Material
Ag2Ga
NA
Needle Length
1-3 μm
3-7 μm
7-13 μm
NA
Tip radius of curvature
50 nm
20 -100 nm
Needle Angle
12°
7°-15°
Needles Electrical Resistivity
1.05×10-7 Ωm
1 – 1.1 ×10-7 Ωm
Electrical resistance of tip and AFM cantilever
1-3 μm
3-7 μm
7-13 μm
1-3 μm
3-7 μm
7-13 μm
30 Ω
65 Ω
100 Ω
15-45 Ω
50-80 Ω
80-120 Ω

 

AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant0.2 N/m0.07 – 0.4 N/m
Resonance Freq.13 kHz9 – 17 kHz
Cantilever Length450 μm440 – 460 μm
Cantilever Mean Width50 μm45 – 55 μm
Cantilever Thickness2.0 μm1.0 – 3.0 μm
Cantilever Shape Cross-sectionBeam
Number of Cantilevers1 per chip
Tip Height17 μm ( not including needle )
Tip Offset15 – 25 μm
Needle MaterialAg2Ga
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingGold reflex (on both side)
Nanoneedle specification
Technical DataTypicalRange
Needle Material
Ag2Ga
NA
Needle Length
1-3 μm
3-7 μm
7-13 μm
NA
Tip radius of curvature
50 nm
20 -100 nm
Needle Angle
12°
7°-15°
Needles Electrical Resistivity
1.05×10-7 Ωm
1 – 1.1 ×10-7 Ωm
Electrical resistance of tip and AFM cantilever
1-3 μm
3-7 μm
7-13 μm
1-3 μm
3-7 μm
7-13 μm
30 Ω
65 Ω
100 Ω
15-45 Ω
50-80 Ω
80-120 Ω

 

AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant
3 N/m
1 – 7 N/m
Resonance Freq.
60 kHz
45- 75 kHz
Cantilever Length
225 μm
210 – 235 μm
Cantilever Mean Width
30 µm
27 – 37 µm
Cantilever Thickness
2.0 μm
1.5 – 3.5µm
Cantilever Shape Cross-sectionRectangular / Trapezoidal
Number of Cantilevers1 per chip
Tip Height14 μm ( not including needle )
Tip Offset15 – 25 μm
Needle MaterialAg2Ga
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingGold reflex (on non-tip side)
Nanoneedle specification
Technical DataTypicalRange
Needle Material
Ag2Ga
NA
Needle Length
1-3 μm
3-7 μm
7-13 μm
NA
Tip radius of curvature
50 nm
20 -100 nm
Needle Angle
12°
7°-15°
Needles Electrical Resistivity
1.05×10-7 Ωm
1 – 1.1 ×10-7 Ωm
Electrical resistance of tip and AFM cantilever
1-3 μm
3-7 μm
7-13 μm
1-3 μm
3-7 μm
7-13 μm
30 Ω
65 Ω
100 Ω
15-45 Ω
50-80 Ω
80-120 Ω

 

AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant40 N/m25 – 75 N/m
Resonance Freq.300 kHz200- 400 kHz
Cantilever Length125 μm115 – 145 μm
Cantilever Mean Width40 µm35 – 45 µm
Cantilever Thickness4.0 μm3.5 – 4.5µm
Cantilever Shape Cross-sectionRectangular / Trapezoidal
Number of Cantilevers1 per chip
Tip Height14 μm ( not including needle )
Tip Offset15 – 25 μm
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingGold reflex (on non-tip side)

* NanoNeedle longer than 10 μm will be provided by special order (Max 100μm)
* Different coating materials are available

Nanoneedle specification
Technical DataTypicalRange
Needle Material
Ag2Ga
NA
Needle Length
1-3 μm
3-7 μm
7-13 μm
NA
Tip radius of curvature
50 nm
20 -100 nm
Needle Angle
12°
7°-15°
Needles Electrical Resistivity
1.05×10-7 Ωm
1 – 1.1 ×10-7 Ωm
Electrical resistance of tip and AFM cantilever
1-3 μm
3-7 μm
7-13 μm
1-3 μm
3-7 μm
7-13 μm
30 Ω
65 Ω
100 Ω
15-45 Ω
50-80 Ω
80-120 Ω

 

AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant0.2 N/m0.07 – 0.4 N/m
Resonance Freq.13 kHz9 – 17 kHz
Cantilever Length450 μm440 – 460 μm
Cantilever Mean Width50 μm45 – 55 μm
Cantilever Thickness2.0 μm1.0 – 3.0 μm
Cantilever Shape Cross-sectionBeam
Number of Cantilevers1 per chip
Tip Height17 μm ( not including needle )
Tip Offset15 – 25 μm
Needle MaterialAg2Ga
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingGold reflex (on both side)
Nanoneedle specification
Technical DataTypicalRange
Needle Material
Ag2Ga
NA
Needle Length
1-3 μm
3-7 μm
7-13 μm
NA
Tip radius of curvature
50 nm
20 -100 nm
Needle Angle
12°
7°-15°
Needles Electrical Resistivity
1.05×10-7 Ωm
1 – 1.1 ×10-7 Ωm
Electrical resistance of tip and AFM cantilever
1-3 μm
3-7 μm
7-13 μm
1-3 μm
3-7 μm
7-13 μm
30 Ω
65 Ω
100 Ω
15-45 Ω
50-80 Ω
80-120 Ω

 

AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant
3 N/m
1 – 7 N/m
Resonance Freq.
60 kHz
45- 75 kHz
Cantilever Length
225 μm
210 – 235 μm
Cantilever Mean Width
30 µm
27 – 37 µm
Cantilever Thickness
2.0 μm
1.5 – 3.5µm
Cantilever Shape Cross-sectionRectangular / Trapezoidal
Number of Cantilevers1 per chip
Tip Height14 μm ( not including needle )
Tip Offset15 – 25 μm
Needle MaterialAg2Ga
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingGold reflex (on non-tip side)
Nanoneedle specification
Technical DataTypicalRange
Needle Material
Ag2Ga
NA
Needle Length
1-3 μm
3-7 μm
7-13 μm
NA
Tip radius of curvature
50 nm
20 -100 nm
Needle Angle
12°
7°-15°
Needles Electrical Resistivity
1.05×10-7 Ωm
1 – 1.1 ×10-7 Ωm
Electrical resistance of tip and AFM cantilever
1-3 μm
3-7 μm
7-13 μm
1-3 μm
3-7 μm
7-13 μm
30 Ω
65 Ω
100 Ω
15-45 Ω
50-80 Ω
80-120 Ω

 

AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant40 N/m25 – 75 N/m
Resonance Freq.300 kHz200- 400 kHz
Cantilever Length125 μm115 – 145 μm
Cantilever Mean Width40 µm35 – 45 µm
Cantilever Thickness4.0 μm3.5 – 4.5µm
Cantilever Shape Cross-sectionRectangular / Trapezoidal
Number of Cantilevers1 per chip
Tip Height14 μm ( not including needle )
Tip Offset15 – 25 μm
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingGold reflex (on non-tip side)

* NanoNeedle longer than 10 μm will be provided by special order (Max 100μm)
* Different coating materials are available

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