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Atomic Force Microscopy Probes
High Aspect Ratio Probes
Conducting Probes
Simple Geometry Probes
Scanning Tunneling Microscopy Probes
Ultra-Sharp PtIr probe
Semi-Sharp PtIr probe
Etched Tungsten Probes
Ultra Sharp NanoProbe
Quartz Tuning Fork Probes
Tip Enhanced Raman Spectroscopy Probes
Scanning Electrochemical Microscopy
Exposed End AFM Probe
Exposed End NeedleProbe
Exposed end STM Probe
Probes Array
NanoCantilever
Services
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Videos
Papers
Brochure
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Atomic Force Microscopy Probes
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Simple Geometry Probes
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Simple Geometry probe
NN-SG
Simple geometry probe
Starting from
$
750.00
Specs:
Simple geometry probe
on 13 KHz, 0.4 N/m AFM cantilever
on 60 KHz, 3 N/m AFM cantilever
on 300 KHz, 40 N/m AFM cantilever
,
Diameter: 250 nm
Diameter: 500 nm
Diameter: 750 nm
, Backside Au coated.
NN-SG quantity
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