Simple Geometry probe

NN-SG
Simple geometry probe

Starting from

$750.00

Specs: Simple geometry probe on 13 KHz, 0.4 N/m AFM cantilever on 60 KHz, 3 N/m AFM cantilever on 300 KHz, 40 N/m AFM cantilever, Diameter: 250 nm Diameter: 500 nm Diameter: 750 nm, Backside Au coated.

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AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant0.4 N/m0.1 – 0.8 N/m
Resonance Freq.13 kHz9 – 17 kHz
Cantilever Length450 μm440 – 460 μm
Cantilever Mean Width50 μm45 – 55 μm
Cantilever Thickness2.0 μm1.0 – 3.0 μm
Cantilever Shape Cross-sectionBeam
Number of Cantilevers1 per chip
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingBio-compatible highly durable carbon based material
Tip Radius of Curvature250 nm
Number of AFM probes10 AFM probes
AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant0.4 N/m0.1 – 0.8 N/m
Resonance Freq.60 kHzkHz
Cantilever Length450 μm440 – 460 μm
Cantilever Mean Width50 μm45 – 55 μm
Cantilever Thickness2.0 μm1.0 – 3.0 μm
Cantilever Shape Cross-sectionBeam
Number of Cantilevers1 per chip
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingBio-compatible highly durable carbon based material
Tip Radius of Curvature750 nm
Number of AFM probes25 AFM probes
AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant0.4 N/m0.1 – 0.8 N/m
Resonance Freq.300 kHzkHz
Cantilever Length450 μm440 – 460 μm
Cantilever Mean Width50 μm45 – 55 μm
Cantilever Thickness2.0 μm1.0 – 3.0 μm
Cantilever Shape Cross-sectionBeam
Number of Cantilevers1 per chip
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingBio-compatible highly durable carbon based material
Tip Radius of Curvature500 nm
Number of AFM probes25 AFM probes

AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant0.4 N/m0.1 – 0.8 N/m
Resonance Freq.13 kHz9 – 17 kHz
Cantilever Length450 μm440 – 460 μm
Cantilever Mean Width50 μm45 – 55 μm
Cantilever Thickness2.0 μm1.0 – 3.0 μm
Cantilever Shape Cross-sectionBeam
Number of Cantilevers1 per chip
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingBio-compatible highly durable carbon based material
Tip Radius of Curvature250 nm
Number of AFM probes10 AFM probes
AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant0.4 N/m0.1 – 0.8 N/m
Resonance Freq.60 kHzkHz
Cantilever Length450 μm440 – 460 μm
Cantilever Mean Width50 μm45 – 55 μm
Cantilever Thickness2.0 μm1.0 – 3.0 μm
Cantilever Shape Cross-sectionBeam
Number of Cantilevers1 per chip
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingBio-compatible highly durable carbon based material
Tip Radius of Curvature750 nm
Number of AFM probes25 AFM probes
AFM Cantilever Specifications
Technical DataTypicalRange
Force Constant0.4 N/m0.1 – 0.8 N/m
Resonance Freq.300 kHzkHz
Cantilever Length450 μm440 – 460 μm
Cantilever Mean Width50 μm45 – 55 μm
Cantilever Thickness2.0 μm1.0 – 3.0 μm
Cantilever Shape Cross-sectionBeam
Number of Cantilevers1 per chip
Cantilever and Chip MaterialSingle Crystal Silicon
Chip Size (industry standard)3400 μm (L) x 1600 μm (W) x 300 μm (T)
CoatingBio-compatible highly durable carbon based material
Tip Radius of Curvature500 nm
Number of AFM probes25 AFM probes

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