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Simple Geometry probe
NN-SG
Simple geometry probe
Starting from
$750.00
Specs: Simple geometry probe on 13 KHz, 0.4 N/m AFM cantilever on 60 KHz, 3 N/m AFM cantilever on 300 KHz, 40 N/m AFM cantilever, Diameter: 250 nm Diameter: 500 nm Diameter: 750 nm, Backside Au coated.
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| AFM Cantilever Specifications | ||
|---|---|---|
| Technical Data | Typical | Range |
| Force Constant | 0.4 N/m | 0.1 – 0.8 N/m |
| Resonance Freq. | 13 kHz | 9 – 17 kHz |
| Cantilever Length | 450 μm | 440 – 460 μm |
| Cantilever Mean Width | 50 μm | 45 – 55 μm |
| Cantilever Thickness | 2.0 μm | 1.0 – 3.0 μm |
| Cantilever Shape Cross-section | Beam | |
| Number of Cantilevers | 1 per chip | |
| Cantilever and Chip Material | Single Crystal Silicon | |
| Chip Size (industry standard) | 3400 μm (L) x 1600 μm (W) x 300 μm (T) | |
| Coating | Bio-compatible highly durable carbon based material | |
| Tip Radius of Curvature | 250 nm | |
| Number of AFM probes | 10 AFM probes | |
| AFM Cantilever Specifications | ||
|---|---|---|
| Technical Data | Typical | Range |
| Force Constant | 0.4 N/m | 0.1 – 0.8 N/m |
| Resonance Freq. | 60 kHz | kHz |
| Cantilever Length | 450 μm | 440 – 460 μm |
| Cantilever Mean Width | 50 μm | 45 – 55 μm |
| Cantilever Thickness | 2.0 μm | 1.0 – 3.0 μm |
| Cantilever Shape Cross-section | Beam | |
| Number of Cantilevers | 1 per chip | |
| Cantilever and Chip Material | Single Crystal Silicon | |
| Chip Size (industry standard) | 3400 μm (L) x 1600 μm (W) x 300 μm (T) | |
| Coating | Bio-compatible highly durable carbon based material | |
| Tip Radius of Curvature | 750 nm | |
| Number of AFM probes | 25 AFM probes | |
| AFM Cantilever Specifications | ||
|---|---|---|
| Technical Data | Typical | Range |
| Force Constant | 0.4 N/m | 0.1 – 0.8 N/m |
| Resonance Freq. | 300 kHz | kHz |
| Cantilever Length | 450 μm | 440 – 460 μm |
| Cantilever Mean Width | 50 μm | 45 – 55 μm |
| Cantilever Thickness | 2.0 μm | 1.0 – 3.0 μm |
| Cantilever Shape Cross-section | Beam | |
| Number of Cantilevers | 1 per chip | |
| Cantilever and Chip Material | Single Crystal Silicon | |
| Chip Size (industry standard) | 3400 μm (L) x 1600 μm (W) x 300 μm (T) | |
| Coating | Bio-compatible highly durable carbon based material | |
| Tip Radius of Curvature | 500 nm | |
| Number of AFM probes | 25 AFM probes | |
| AFM Cantilever Specifications | ||
|---|---|---|
| Technical Data | Typical | Range |
| Force Constant | 0.4 N/m | 0.1 – 0.8 N/m |
| Resonance Freq. | 13 kHz | 9 – 17 kHz |
| Cantilever Length | 450 μm | 440 – 460 μm |
| Cantilever Mean Width | 50 μm | 45 – 55 μm |
| Cantilever Thickness | 2.0 μm | 1.0 – 3.0 μm |
| Cantilever Shape Cross-section | Beam | |
| Number of Cantilevers | 1 per chip | |
| Cantilever and Chip Material | Single Crystal Silicon | |
| Chip Size (industry standard) | 3400 μm (L) x 1600 μm (W) x 300 μm (T) | |
| Coating | Bio-compatible highly durable carbon based material | |
| Tip Radius of Curvature | 250 nm | |
| Number of AFM probes | 10 AFM probes | |
| AFM Cantilever Specifications | ||
|---|---|---|
| Technical Data | Typical | Range |
| Force Constant | 0.4 N/m | 0.1 – 0.8 N/m |
| Resonance Freq. | 60 kHz | kHz |
| Cantilever Length | 450 μm | 440 – 460 μm |
| Cantilever Mean Width | 50 μm | 45 – 55 μm |
| Cantilever Thickness | 2.0 μm | 1.0 – 3.0 μm |
| Cantilever Shape Cross-section | Beam | |
| Number of Cantilevers | 1 per chip | |
| Cantilever and Chip Material | Single Crystal Silicon | |
| Chip Size (industry standard) | 3400 μm (L) x 1600 μm (W) x 300 μm (T) | |
| Coating | Bio-compatible highly durable carbon based material | |
| Tip Radius of Curvature | 750 nm | |
| Number of AFM probes | 25 AFM probes | |
| AFM Cantilever Specifications | ||
|---|---|---|
| Technical Data | Typical | Range |
| Force Constant | 0.4 N/m | 0.1 – 0.8 N/m |
| Resonance Freq. | 300 kHz | kHz |
| Cantilever Length | 450 μm | 440 – 460 μm |
| Cantilever Mean Width | 50 μm | 45 – 55 μm |
| Cantilever Thickness | 2.0 μm | 1.0 – 3.0 μm |
| Cantilever Shape Cross-section | Beam | |
| Number of Cantilevers | 1 per chip | |
| Cantilever and Chip Material | Single Crystal Silicon | |
| Chip Size (industry standard) | 3400 μm (L) x 1600 μm (W) x 300 μm (T) | |
| Coating | Bio-compatible highly durable carbon based material | |
| Tip Radius of Curvature | 500 nm | |
| Number of AFM probes | 25 AFM probes | |
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